This report presents a package analysis of the STMicroelectronics VG6640AB1M 1.3 MP CMOS image sensor used for automotive, security, and other outdoor applications.
The PKG includes observed device metrics and salient features supported by the following unannotated image folders:

• Package photographs and X-ray images
• Die photographs
• Optical and SEM package cross-section photographs
• SEM-EDS spectra of selected package materials

The image set for a PKG project is derived from a package cross sectional analysis, supplemented by jet etch decapsulation, when applicable. Value added information, such as additional planes of cross-sectioning, may be included on a case-by-case basis. The PKG deliverable provides competitive benchmarking information and enables cost-effective tracking of multiple competitors' technology.