This report presents a Basic Functional Analysis of the Semtech TL378V2 die found inside the Semtech SX1272IMLTRT LoRa long range transceiver.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• Scanning electron microscopy (SEM) cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
• Measurements of vertical and horizontal dimensions of major microstructural features
• Plan-view optical micrograph of the die delayered to diffusion
• Identification of major functional blocks on a diffusion die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and diffusion die photographs delivered in the ICWorks Browser
• Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process