system-on-chip (SoC) design rules used on the Apple A11 APL1W72.
The report contains the following detailed information:
- Downstream product features and SoC-level areas of analysis
- Technology node contact and back-end-of-line (BEOL) process architecture assessment with stack up dimensions
- Features and dummy structures of the system-on-chip (SoC) design overhead associated with the transition between design IP blocks
- Scanning electron microscope (SEM) montage image of the analyzed bevel areas delivered in ICWorks Browser or CircuitVision
- Target areas are typically transitions between different types of IP blocks, such as analog I/O to digital, or to memory, and typically contain many dummy features





