This is a DEP summary document, provided as a companion deliverable for a Device Essentials Plus project. The DEP deliverable builds on the content generated in a Device Essentials (DEF) project. The purpose of the DEP is to extend coverage of chip analysis beyond the SEM-based imaging used for DEF projects, and to expand the analyst commentary. A DEP contains interpreted results from TEM, TEM-EDS, TEM-EELS, SIMS and SCM analyses (the DEP scope is target device dependent).