Tailored Memory analysis to meet your needs
Huge up-front R&D investment requires customers to have up-to-date and accurate competitive intelligence
Our analysis quantifies the unknown to help you make informed decisions. We can determine what it will cost to bring advanced memory to market, we research potential market challenges to help you determine what your risks are, and we help define your de-risking strategy.
Available Memory Subscriptions
TechInsights Memory offerings have been developed to provide the focused technical intelligence you need based on your industry and role.
DRAM Functional Analysis (MFR)
Includes:
- Executive summary supported with image sets
- Process node and foundry identification
- Critical dimensions
- Functional block summary
- Stacked optical top metal and poly die photo delivered in CircuitVision. Includes calibrated measurement and annotations tools
- SEM cross-sectional and bevel imaging
- 13-15 reports/year
DRAM: SWD and Sense Amp Transistor Characterization
Includes:
- Transitor Characterization Report (TCR)
- Universal curves for IOFF vs. ION and IOFF vs. ID, LIN derived from
- 5 NMOS and 5 PMOS sub wordline driver transistors, across multiple VDD at 85°C
- 5 NMOS and 5 PMOS sense amp transitors, across multiple VDD at 85°C
- For each universal curve data point
- Transistor Characteristics: ID, SAT, ID, Lin, Ioff, VT, Lin & VT, SAT, ΔVGS, Gm, SS, DIBL
- Output Characteristics
- Universal curves for IOFF vs. ION and IOFF vs. ID, LIN derived from
- Analysis Coverage
- 4 reports/year
- Trend Analysis
- 4 hrs support
DRAM Periphery Design (MDP): Sense Amp, Sub Wordline Driver
Includes:
- Concise analyst's summary of critical device metrics
- Circuit schematic diagram of sense amplifier
- Circuit schematic diagram of a sub wordline driver
- Detailed stacked SEM images of a delayered DRAM sense amplifier and sub wordline driver delivered in CircuitVision. Includes calibrated measurement and annotation tools
- ~4 reports/year
DRAM: Circuit Analysis
Includes:
- Full Circuit Analysis
- 1 - Memory Array and Peripherals
- 2 - Address Path
- 3 - Data Path
- 4 - Control Blocks, Configuration and Test Block
- 5 - Voltage Generators System
- Select Blocks Circuit Analysis
- 1 - Memory Array and Peripherals
- 3 - Data Path
- 5 - Voltage Generators System*
*Depending upon events and customer interest, TechInsights may produce 1 Select Blocks Circuit Analysis including blocks (1, 3, 5) or 2 Select Blocks Circuit Analysis including blocks (1, 3)
- Analysis Coverage
- Full 1/year
- Select Blocks 1/year
NAND Functional Analysis
Includes:
- Analysis Coverage
- Executive summary supported with image sets
- Process Node and Foundry Identification
- Critical Dimensions
- Functional Block Summary
- Stacked optical top metal and poly die photo delivered in CircutVision which includes calibrated measurement tools
- SEM cross-sectional imaging
- 13-15 reports/year
- Executive summary supported with image sets
NAND Periphery Design (MDP): Page Buffer, Wordline Driver
Includes:
- Concise analyst's summary of critical device metrics
- Circuit schematic diagram of a page buffer: decoder, switch, and controller
- Circuit schematic diagram of a wordline driver: decoder and switch
- Detailed stacked plan view SEM images of a beveled NAND page buffer and wordline driver delivered in CircuitVision. CircuitVision includes calibrated measurement and annotation tools
- ~4 reports/year
NAND: Circuit Analysis
Includes:
- Full Circuit Analysis
- 1 - Memory Array and Peripherals
- 2 - Address Path
- 3 - Data Path
- 4 - Control Blocks, Configuration and Test Block
- 5 - Voltage Generators System
- Select Blocks Circuit Analysis
- 1 - Memory Array and Peripherals
- 3 - Data Path
- 5 - Voltage Generators System*
*Depending upon events and customer interest, TechInsights may produce 1 Select Blocks Circuit Analysis including blocks (1, 3, 5) or 2 Select Blocks Circuit Analysis including blocks (1, 3)
- Analysis Coverage
- Full 1/year
- Select Blocks 1/year
NAND Internal Waveform Analysis
This channel examines the waveforms used on NAND memory cells during program, read and erase cycles.
- Delivers 8 reports over a 12-month period as well as an online seminar
- Provides a Waveform summary PDF and raw waveform .sht files to enable the customer to perform further analysis and measurements
Advanced Process
Includes:
- Advanced Memory Essentials (AME)
- Focused on leading edge NAND and DRAM memory technology
- Executive summary supported by large image sets
- SEM cross-sectional and bevel imaging
- TEM cross-sectional analysis with TEM EDS
- 8 reports/year
- Analysis Coverage
- Technical trend/roadmap by technology element
- Design technology interaction analysis
- Detailed explanation of process integrations
- Next node predictions
- 3 briefings/year
- Trend analysis
- Forecasting
- 1 annual seminar
- 4 hrs support
Process Flows
*Requires Advanced Process Subscription
Includes:
- Process Flow Analysis (PFA)
- Spreadsheets showing process, architecture, mask list, and integration-level process steps
- 8 Memory / year
- Process Flow Full Emulation (PFF)
- PFA content may be updated
- Layout GDS fully decomposed into process layers
- 3D Emulation
- Synopsys Input (Route-Level Deck)*
*Requires Synopsys license to view and modify - 6 Memory / year
- Analysis Coverage
- Cell Design technology interaction analysis
- Detailed explanation of process integration from wafer-in through wafer-out
- Process steps, materials, equipment type, unit process
- SEM and TEM cross-sectional and top-view images
- Layer annotations, specific process module, assumption
- Trend analysis
- +4 hrs support
Embedded & Emerging Functional Analysis (MFR)
Includes:
- Analysis Coverage
- Focused on leading-edge embedded and emerging memory technology
- Executive summary supported with image sets
- Process Node and Foundry Identification
- Critical Dimensions
- Functional Block Summary
- Stacked optical top metal and poly die photo delivered in CircuitVisionTM
- SEM bevel
- SEM cross-sectional imaging
- 4 reports/year
Embedded & Emerging Process Analysis
Includes:
- Analysis Coverage
- Focused on leading-edge embedded and emerging memory
- Executive summary supported by large image sets
- SEM cross-sectional and bevel imaging
- TEM cross-sectional with TEM EDS
- Technical trend/roadmap by technology element
- Design technology interaction analysis
- Detailed explanation of process integrations
- Next node predictions
- 4 reports/year
- Trend Analysis - 1 briefing / year
- Forecasting
- Q&A
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