Samsung S3JU100 28nm 4 Mb eFlash Advanced Memory Essentials

2 Min Read December 8, 2025

Samsung S3JU100 AME report: key device metrics, TEM-EDS/EELS analysis, and image folders highlighting critical memory features.

This Advanced Memory Essentials (AME) report of the Samsung S3JU100 die includes a concise analyst’s summary of critical device metrics, transmission electron microscopy-based energy dispersive X-ray spectroscopy (TEM-EDS) and/or TEM-based electron energy loss spectroscopy (TEM-EELS) results, and salient features supported by unannotated image folders.

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