Product Code
AME-2103-803
Release Date
Availability
Published
Product Item Code
INT-29F08T2A0CQK1
Device Manufacturer
Intel
Device Type
NAND Flash
Subscription
Memory - NAND & DRAM
Channel
Memory - Process
Intel 144L QLC 1Tb 3D NAND Advanced Memory Essentials
The concise analysis summary report of critical device metrics, transmission electron microscopy-based energy dispersive X-ray spectroscopy (TEM-EDS) and TEM-based electron energy loss spectroscopy (TEM-EELS) results, and salient features, supported by the following image folders:
  • Downstream product teardown
  • Package photographs and X-rays, top metal and polysilicon die photographs
  • SEM cross section along the word line (WL) and the bit line (BL) of the 3D NAND array
  • TEM cross section along the BL direction (BLD)
  • TEM cross section along the WL direction (BLD)
  • SEM bevel
    • Memory array
    • Memory array edge
    • Periphery at the polysilicon level
The results of TEM-EDS analyses are included in the AME summary document. The AME deliverable provides timely competitive benchmarking information and enables cost-effective tracking of technical innovation across a breadth of competitors.

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