This report presents a Transistor Characterization of the S5E7420A01 die found in the Samsung Exynos 7 Octa 7420. The transistor characterization was performed using an atomic force nanoprober (AFP). Logic transistors in the Cortex-A57 CPU core were targeted for the analysis. The transfer characteristics for 20 transistors (10 NMOS and 10 PMOS) were measured in the CPU standard logic and universal curves were extracted.