A Functional Analysis report provides a thorough benchmarking analysis of this new Freescale Applications processor for mobile convergence. Customers will gain knowledge of the process technology with the design floor plan layout. Process generation is identified and SEM cross-sections are provided of the die and transistor structures. Utilizing de-layered images of the die together with commercially available information the functional blocks are identified and the die utilization is provided. Memory cell types are characterized and individual memory cell are imaged to show cell layout.