Product Item Code
Memory - NAND & DRAM
Memory - NAND Circuit Analysis
Intel/Micron MT29F512G08EBHBF-R_B Selected Block Circuit Analysis Report
The following is a CircuitVision Analysis report on the Micron Technology MT29F512G08EBHBF-R_B, 96-layer 3D NAND flash memory (B27A die). The following report contains a full set of schematics and annotated photographs divided into the following sections:
- Architectural Overview
- Array and Peripherals
- Data Path
- Symbol Definitions
- Major Findings
- Standard Cells
- Appendix A - Signal List
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