Solidigm 1.33Tb 192L QLC 3D NAND Internal Waveform Analysis
This is a Internal Waveform Overview (IWO) containing the program, read, and erase waveforms for the Solidigm 1.33 Tb 192L QLC 3D NAND flash memory device. The analysis provides an overview of the internal voltages required to program, read, and erase the flash memory cells. The waveform analysis tests the flash in an active probe arrangement and voltage traces of four signals are recorded during program, read and erase operations while the device is active on the source Solidigm SBFPF2BU038T001 SSD.
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