Device Yield, Reliability, and Performance Boost Strategies in Navitas’ NV6245C Gen 3 GaNFast with GaNSense Half-Bridge IC

Device Yield, Reliability, and Performance Boost Strategies in Navitas’ NV6245C Gen 3 GaNFast with GaNSense Half-Bridge IC

 
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TechInsights has completed the Power Essentials analysis of the Navitas Semiconductor’s Gen 3 GaN GaNFast and GaNSense Power IC NV6245C (PEG-2309-801), focusing on the low side GaN HEMT die. Various reliability, yield, and performance boost strategies have been observed, and the Key findings are presented and discussed in this blog.

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