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Published: 21 July 2017

This report presents a Transistor Characterization of the logic transistors found in the Intel Optane 29P16B1BLDNF2 3D XPoint™ non-volatile memory. The measurements include transfer and output characteristics, body effect and DIBL.

Report Description

This report presents a Transistor Characterization of the logic transistors found in the Intel Optane 29P16B1BLDNF2 3D XPoint™ non-volatile memory.

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