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Published: 5 April 2018

The Advanced Memory Essentials (AME) deliverable embedded eNOR flash comprises a concise analyst’s summary document highlighting observed critical dimensions and salient features supported by the following image folders:

  • Downstream product teardown
  • Package X-rays, top metal and polysilicon die photographs, non-invasive optical photographs of die features
  • SEM bevel through the flash memory array and periphery logic
  • SEM cross section of the general device structure, flash memory along bit lines
  • Four TEM cross sections, HV transistors, logic transistors, flash memory along bit lines, metals/ILD stack
The results of TEM-EDS analyses are included in the AME summary document. The AME deliverable provides timely competitive benchmarking information and enables cost-effective tracking of technical innovation across a breadth of competitors.

Report Description

This product presents an Advanced Memory Essentials Image Set and Summary of the Ambiq Micro C01 Apollo2 MCU with embedded 40 nm eNOR flash memory.

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The Device Essentials deliverable for imaging devices includes a one page summary of observed device metrics and salient features. The summary is supported by the following unannotated image folders: ...