Broadcom 4FR9A Process Node Assessment with TEM Option

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Front End Module
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This report presents a Process Node Assessment of the Broadcom 4FR9A RF antenna tuner die found inside the Broadcom AFEM-8072 package. The AFEM-8072 was extracted from the main printed circuit board (PCB) of the Apple iPhone 8.
This report contains the following detailed information:
  • Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
  • SEM cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
  • Measurements of vertical and horizontal dimensions of major microstructural features
  • Transmission electron microscopy (TEM) cross-sectional micrographs of the transistors and the gate oxide
  • TEM-based energy dispersive spectroscopy (TEM-EDS) analysis of the dielectrics, metals, and transistors
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