![](/sites/default/files/styles/product_featured/public/PKG-2201-804.jpg?h=53873e96&itok=f7S7VvBy)
The PKG includes observed device metrics and salient features supported by the following unannotated image folders:
- Package photographs and X-ray images
- Die photographs
- Optical and SEM package cross-section photographs
- SEM-EDS spectra of selected package materials
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