Samsung KLUEG8U1EA-B0C1 64L 3D V-NAND Flash (eUFS/UFS2.1) Memory Functional Analysis

This report presents a Memory Functional Analysis of the Samsung K9AFGD8H0A die found inside the Samsung KLUEG8U1EA-B0C1 package. The KLUEG8U1EA-B0C1 was extracted from a Samsung Galaxy S9+ smartphone with the model number SM-G965N.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• Scanning electron microscopy (SEM) cross-sectional micrographs across the memory array showing the general structure of the flash cell array, die dielectric materials, metal interconnects, major features, and transistors
• Measurements of vertical and horizontal dimensions of major microstructural features
• Plan-view optical micrograph of the die delayered to diffusion layer
• Identification of major functional blocks on a diffusion layer die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and diffusion level die photographs delivered in the CircuitVision software