This report presents a Basic Floorplan Analysis of the NXP zRE231 and tNT3H12V1A dies found inside the NXP K32W061 component. The ARM Cortex-M4 MCU supports the Bluetooth LE 5.0, ZigBee 3.0, and thread. The device has an internal NFC tag and has multi-standard supported SoC for smart home applications.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• SEM cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
• Measurements of vertical and horizontal dimensions of major microstructural features
• Plan-view optical micrograph of the die delayered to the polysilicon layer
• Identification of major functional blocks on a polysilicon die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and polysilicon die photographs delivered in the CircuitVision software
• Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process