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Published: 29 October 2017

This project presents a Standard Cell Essentials analysis of the Apple A11 APL1W72 DDR I/O region. It is a collection of SEM montage images showing the transition between an I/O IP block and a digital logic block, showcasing the relationship to
system-on-chip (SoC) design rules used on the Apple A11 APL1W72.

The report contains the following detailed information:

  • Downstream product features and SoC-level areas of analysis
  • Technology node contact and back-end-of-line (BEOL) process architecture assessment with stack up dimensions
  • Features and dummy structures of the system-on-chip (SoC) design overhead associated with the transition between design IP blocks
  • Scanning electron microscope (SEM) montage image of the analyzed bevel areas delivered in ICWorks Browser or CircuitVision
  • Target areas are typically transitions between different types of IP blocks, such as analog I/O to digital, or to memory, and typically contain many dummy features

Report Description

This project presents a Standard Cell Essentials analysis of the Apple A11 APL1W72 DDR I/O region. It is a collection of SEM montage images showing the transition between an I/O IP block and a digital logic block, showcasing the relationship to system-on-chip (SoC) design rules used on the Apple A11 APL1W72.

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